White light interferometry (WLI) is a non‐contact optical method that exploits the interference of broadband light to obtain high‐resolution three‐dimensional maps of surface topographies. By ...

White light interferometry (WLI) is a contact-free optical method for measuring surface height. It uses the phase difference between the light reflected off a reference mirror and the target sample to ...

Almost a century ago the concept of measuring surface roughness started as a way to stop disputes and uncertainty between buyers and manufacturers. Today, it is a common identifier that is utilized ...

Accurately controlling film thickness and uniformity is extremely important for both throughput and performance in the automotive, aerospace, semiconductor, medical, and research industries. White ...