Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...
Metrology is the science of measuring, characterizing, and analyzing materials. Within metrology, there are several technologies used to detect material defects on a very small scale – precision on ...
Amazon today announced the general availability of Amazon Lookout for Vision, a cloud service that analyzes images using computer vision to spot product or process defects and anomalies in ...
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