Failure analysis (FA) is an essential step for achieving sufficient yield in semiconductor manufacturing, but it’s struggling to keep pace with smaller dimensions, advanced packaging, and new power ...

Driven by a plethora of benefits, data sharing is gradually becoming a “must have” for advanced device nodes and multi-die ...

“Four years ago, that was at 50% and it’s steadily increased since,” said Tristan Erion-Lorico. Image: Kiwa PVEL. A total of 83% of module manufacturers have had at least one test failure in the Kiwa ...

Meta trained one of its AI models, called Llama 3, in 2024 and published the results in a widely covered paper. During a 54-day period of pre-training, Llama 3 experienced 466 job interruptions, 419 ...

The proposed framework for human performance reliability evaluation consists of three phases. First, data is obtained via subjective worker self-assessments and objective expert evaluations. Second, ...

[This article was first published in Army Sustainment Professional Bulletin, which was then called Army Logistician, volume 1, number 2 (November–December 1969), pages 8–11, 24–25.] “… in the process ...