Comparing die test results with other die on a wafer helps identify outliers, but combining that data with the exact location of an outlier offers a much deeper understanding of what can go wrong and ...

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With increasing focus on quality and reliability across all segments beyond just automotive, medical and mil-aero, it is more critical than ever for companies to leverage every byte of test data at ...

Doug Bonderud is an award-winning writer capable of bridging the gap between complex and conversational across technology, innovation and the human condition. By defining a set of normal user and ...