Semiconductor Engineering

Driving Toward Predictive Analytics With Dynamic Parametric Test

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
Nasdaq

Keysight’s New Parallel Parametric Test System Delivers High Throughput and Cost-Effective Wafer Test

SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
EDN

Semiconductor characterization software adds parallel test, parametric die sort features

Cleveland, Ohio — Keithley Instruments, Inc. has announced the availability of its Automated Characterization Suite (ACS) V3.2 software for semiconductor test and characterization at the device, wafer ...
Forbes

Tens Of Thousands Of FMRI Brain Studies May Be Flawed

Everyone's seen pretty pictures of the human brain lit up in bright reds, oranges, yellows and blues. The images are taken from brain-mapping studies that use fMRI (functional Magnetic Resonance ...
JSTOR Daily

Goodness-of-Fit Tests for Parametric Regression Models

Several new tests are proposed for examining the adequacy of a family of parametric models against large nonparametric alternatives. These tests formally check if the bias vector of residuals from ...