A key goal in manufacturing test is to maximize the quality of parts delivered to customers—ideally, shipping zero defective parts while reducing the cost of testing those parts. The arrival of ...
The IDDQ test relies on measuring the supply current (I DD) of an IC’s quiescent state, when the circuit isn’t switching and inputs are held at static values. Test patterns are used to place the ...
Once IC fabrication is complete, engineers use fault models to create test patterns that detect defects. These fault models are typically abstractions of defect behavior based on our experience and ...
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