Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...
Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800–1000x. For further magnification, scanning electron microscopes (SEMs) can ...
Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...
The scalable fabrication of probe tips for near-field scanning optical microscopy creates new opportunities in imaging. The increasing use of nanostructures for photonic applications in sensing and ...
What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...
A technical paper titled “High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy” was published by researchers at Oak Ridge National Laboratory, (ORNL), ...
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