The Ellipsometry is a total optical measurement method. This technique is used to measure the change of polarization of light when passing through a medium. Due to the layer structure during ...

Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...

a, Schematics of a conventional spectroscopic ellipsometry system. b, Schematics of a metasurface array-based single-shot spectroscopic ellipsometry system. The metasurface array-based system for ...

Come learn how to collect measurements on the instrument. Involves hands-on practice of sample alignment and data collection. Due to limited space in the cleanroom, there are only 10 spots available ...

Researchers have shown how spectroscopic measurements can be made much faster. By correlating polarization to the color of a pulsed laser, the team can track changes in the spectrum of the light by ...

This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the workshop includes an introduction, fundamentals of ellipsometric ...

Scientists measured single MXene flakes with light-based micro-ellipsometry, uncovering unique conductivity and optical traits for smarter energy and electronics. (Nanowerk News) Researchers have for ...

(Nanowerk News) Two-dimensional (2D) material flakes consist of single to few atomic layers, granting them extraordinary quantum properties, which are not observed in everyday materials. As a result, ...

In the field of physical optics, a propagating light beam is known as a propagating electromagnetic radiation, with the direction of propagation being horizontal to the direction of the electric and ...