LIVERMORE, Calif. — FormFactor Inc. here today (Feb. 15) announced a major advancement in probe-card technology that enables IC manufacturers to test up to 128 chips on a wafer with a single ...

STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...

To test the durability of the probe cables at high temperatures, we used our finalists in a screaming-hot, 650 °F to 700 °F grill. After our initial round of testing, we used the remaining contenders ...

STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...

Santa Rosa, CA. Keysight Technologies has introduced two extreme-temperature probing solutions: the N7007A extreme-temperature 400-MHz passive probe and the N7013A extreme-temperature extension kit ...

In an extreme heat environment, such as during the sintering of powdered metals, in solid waste incinerators, or in oil or gas fired-furnaces, thermocouple probes need to be able to withstand extreme ...

It’s remarkable how tiny electronics have become. Heaven knows what an old-timer whose experience started with tubes must think, to go from solder tags to SMD in a lifetime is some journey. Even the ...

The µHELIX® line of durable, fine-pitch probes is designed to test electrical targets with ±15-micron pointing accuracy on 10-mil center-to-center placement. Probe diameter sizes are 20, 16, 12, and 8 ...

With its 400-MHz bandwidth, the HVD3220 differential probe from Teledyne LeCroy permits in-circuit GaN and SiC system testing. The high-voltage probe carries a 1500-VDC CAT III rating, as well as a ...

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