Have you stopped to consider the impact of yield on your overall product cost? Of course you did, when you considered your yield targets and set your product goals. But is it good enough to stop once ...

Many sources of yield loss, including out-of-spec equipment, incorrect handling of material, photomask defects, design-process sensitivities, library marginalities, and test issues, can occur during ...

Chipmakers are ramping new tools and methodologies to achieve sufficient yield faster, despite smaller device dimensions, a growing number of systematic defects, immense data volumes, and massive ...

Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed yield ramp on new processes and improves yield on mature processes. Finding the root cause of yield loss is ...

JinkoSolar’s n-type TOPCon modules have been found to deliver significantly higher energy yield per watt compared to n-type BC modules during a three-month field test. The field test, conducted by TÜV ...

The entire stress-strain curve can now be determined using nanoindentation with a flat-ended cylindrical punch and novel analysis of the resulting force-displacement data 1. Unlike pyramidal indenters ...

JA Solar and TÜV Nord have reported the results of a one-year energy yield test carried out at the CPVT National Photovoltaic Experimental Base at Yinchuan. The aim of the test was to study and verify ...