TOKYO — During the Semicon Japan trade show here today, nLine Corp. rolled out its first product–a wafer inspection tool, based on a new and radical holographic imaging technology. The new ...

The current defect inspection systems for packaging are running out of steam for the latest advanced packages, prompting the need for new tools in the market. All of this comes at a time when the ...

Metrology tool vendor Rudolph Technologies Inc. took the wraps off a suite of macro defect equipment today, claiming that it can produce real-time inspection on each critical lithography and wafer ...

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...

HAWTHORNE, N.Y., July 9, 2025 /PRNewswire/ -- Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of ...

MILPITAS, Calif., July 10, 2018 /PRNewswire/ -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced two new defect inspection products, addressing two key challenges in tool and process monitoring ...

insights from industryDr. Thomas FriesFounder and CEOFRT GmbH In this article, AZoM, talks to Dr. Thomas Fries, Founder and CEO of FRT GmbH, about the applications of both defect inspection and ...

What is the Market Size of Wafer Defect Inspection System? BANGALORE, India, Dec. 16, 2025 /PRNewswire/ -- In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth ...

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

San Francisco, CA. KLA-Tencor today announced two new defect-inspection products, addressing key challenges in tool and process monitoring during silicon wafer and chip manufacturing at the ...

France-based company Unity-SC, which specializes in optical inspection tools for semiconductor wafer production, says that its new system will be able to increase yields in laser diode manufacturing.

“Wafer mass metrology has become increasingly important as semiconductor processes have become more complex and sensitive,” said Microtronic CEO Reiner Fenske in making the announcement. “Today’s fabs ...