Automated DIC imaging with the DM6 M microscope enhances six-inch wafer inspection, providing reproducible results and improved efficiency for defect analysis.
Arabian Post on MSN
Siemens boosts chip metrology with Canopus AI acquisition
Siemens has completed the purchase of Canopus AI, a Grenoble-based specialist in artificial intelligence-driven metrology and inspection software, signalling an intensified push into semiconductor ...
Universal semi-automated platform measures diverse wafer materials and surfaces with SEMI and ASTM standard compliance.
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Vyrian Achieves ISO 17025 Accreditation, Strengthening Quality Assurance for Gray Market Electronics
Houston-based testing lab delivers 24-hour turnaround for mission-critical semiconductor verification HOUSTON, TX, ...
Validation of the LIG Nanowise SMAL lens revealed its ability to resolve features down to 137 nm, demonstrating true ...
Photo-reflectance spectroscopy enhances semiconductor quality control with sensitive, contactless measurements of band structure and electric fields in devices.
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