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SAN FRANCISCO, Jan. 21, 2026 /PRNewswire/ -- PI (Physik Instrumente) announced a new technology platform for electro-optical wafer-level testing designed to validate electrical and optical device ...

Abstract: This article presents a cryogenic mode-switching class-F voltage-controlled oscillator (VCO) aimed at addressing the demand for wideband, low phase noise (PN) local oscillator signals in ...

Tomato seedling stems can suffer mechanical damage during automatic grafting, reducing the quality of grafting. This study examined two sources of damage: compression damage to scion stems and bending ...

Abstract: Image anomaly detection plays a pivotal role in industrial inspection. Traditional approaches often demand distinct models for specific categories, resulting in substantial deployment costs.