IEEE

Addressing Domain Shift in Insulator Defect Data: A Generalization Framework for Cross-Domain Detection of Broken and Self-Blast Insulator Defect

Abstract: Accurate and timely detection of insulator defects is essential for the safety and stability of the power system. However, current detection faces challenges of domain shifts arising from ...
Semiconductor Engineering

Catching Critical Defects In TSVs And Stacked Chips

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...
IEEE

Image Style Transfer-Based Data Augmentation for Sanitary Ceramic Defect Detection

Abstract: In the task of surface defect detection on sanitary ceramics, the production environment poses limitations. There are obvious differences between the image data we collected and the image ...
WDAF-TV

Kansas City Council committee advances resolution to review data center impacts

KANSAS CITY, Mo. — Kansas City’s Neighborhood Planning and Development Committee met Tuesday to discuss a resolution regarding the growing number of data centers in the Kansas City area. Resolution ...