Physicists in Germany have carried out the most accurate measurement to date of the width of the proton. By examining a previously unexplored energy-level transition in the hydrogen atom, Lothar ...
Abstract: Spectroscopic ellipsometry is a common method for measuring the thickness of semiconductor thin films on photovoltaic panels. In contrast to conventional spectroscopic ellipsometry ...
Scientists measured single MXene flakes with light-based micro-ellipsometry, uncovering unique conductivity and optical traits for smarter energy and electronics. (Nanowerk News) Researchers have for ...
Monitoring culture media settings is critically important across various industries to enhance cell proliferation for applications such as regenerative medicines and protein synthesis. Numerous ...
ABSTRACT: Haug and Tatum have developed a cosmological model which links the CMB temperature, the Hubble parameter, cosmological redshift, and the Planck length in a manner fully consistent with ...
Semiconductor devices are becoming thinner and more complex, making thin deposited films even harder to measure and control. With 3nm node devices in production and 2nm nodes ramping toward ...
The US National Institute of Standards and Technology (NIST) is discussing plans to eliminate an entire team responsible for publishing and maintaining critical atomic measurement data in the coming ...
Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...
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